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Incorporating a high-performance, electronically cooled semiconductor, equipped with five primary filers, and operated by easy-to-use software, the series of EDX-7000/8100 energy dispersive XRF spectrometers achieve fast, precise EDXRF analysis of a wide range of elements in markets ranging from electronics (RoHS screening), automotive, and chemicals to environmental, pharmaceutical, and food.
The high-performance, state-of-the-art semiconductor (SDD) detector and combination of optimized optics and primary filters achieve outstanding EDXRF sensitivity across the entire range from light to heavy elements. In addition, the SDD reduces the effects of overlapping peaks of different elements, leading to more reliable analytical results.
The high fluorescent X-ray count per unit time (high count rate) of the SDD detector permits precise EDXRF analysis in a shorter measurement time, allowing researchers and labs to increase their productivity without sacrificing accuracy.
The EDX-7000/8100 energy dispersive XRF spectrometers incorporate five primary filters and four collimators. Usable in any combination, the filters enable highly sensitive EDXRF analysis of trace elements while the four different sized collimators reduce scattering with small samples or isolation of measurement area.
The EDX-8100 model features an SDD detector with a special ultra-thin-film window material that is able to detect ultra-light elements such as carbon (C), oxygen (O), and fluorine (F).
Various design features, along with minimal sample preparation, simplify operation for all users. These include:
The EDX-7000/8100 energy dispersive XRF spectrometers are ideal for a variety of applications, including: