[youtube https://www.youtube.com/watch?v=o2XHX3IYUEI]   This application note from Shimadzu showcases the ability of the AIM-9000 microscope to do just that, providing an analysis of a 10 μm contaminant on the surface of an optical part.

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Micro contaminants cause device malfunction in miniaturized devices, such as semiconductors and sensors. Rapid and non-destructive determination of micro-contaminant chemical ID is the first step in figuring out what went wrong and how to fix it.

Get more information about the AIM-9000 here.

  This application note from Shimadzu showcases the ability of the AIM-9000 microscope to do just that, providing an analysis of a 10 μm contaminant on the surface of an optical part.